不然它的原装镜头干啥用?拖带的支架又能干啥?
九大行星 发表于 2011-5-23 22:04
ST-8E KAF-1602E/LE | Point Defects Central 600x800 | Point Defects Total | Cluster Defects Central 600x800 | Total Cluster Defects | Column Defects Central 600x800 | Column Defects Total |
Class 0 | 0 | 0 | 0 | 0 | 0 | 0 |
Class 1 | Up to 2 | Up to 5 | 0 | 0 | 0 | 0 | Class 2 | Up to 5 | Up to 10 | Up to 2 | Up to 4 | 0 | 0 |
Class 3 | Up to 10 | Up to 20 | Up to 4 | Up to 8 | Up to 2 | Up to 4 |
Definitions for KAF-1602E (Non-ABG) Point Defect: DARK: A pixel which deviates by more than 6% from neighboring pixels when illuminated to 70% of saturation, OR BRIGHT: A Pixel with dark current > 5000 e/pixel/sec at 25C. Cluster Defect: A grouping of not more than 5 adjacent point defects Column Defect: A grouping of >5 contiguous point defects along a single column, OR A column containing a pixel with dark current > 12,000e/pixel/sec, OR A column that does not meet the minimum vertical CCD charge capacity, OR A column that loses more than 250e under 2Ke illumination. Neighboring pixels: The surrounding 128 x 128 pixels or ±64 columns/rows. Defect Separation: Column and cluster defects are separated by no less than two (2) pixels in any direction (excluding single pixel defects). Defect Region Exclusion: Defect region excludes the outer two (2) rows and columns at each side/end of the sensor
柯达的CCD 分级标准,找了一个像素值和Q5差不多的芯片对比。看的懂看。看不懂继续叫。补充一点我们一般承受得起的就到CLASS2了再往上价格就是成倍的涨了。 |